EVALUATION OF LARGE ABERRATIONS USING A LATERAL-SHEAR INTERFEROMETER HAVING VARIABLE SHEAR

被引：148

作者：

RIMMER, MP ^{[1
]}

WYANT, JC ^{[1
]}

机构：

[1] ITEK CORP,OPTICAL SYST DIV,LEXINGTON,MA 02173

来源：

APPLIED OPTICS | 1975年 / 14卷 / 01期

关键词：

D O I：

10.1364/AO.14.000142

中图分类号：

O43 [光学];

学科分类号：

070207 ; 0803 ;

摘要：

引用

收藏

页码：142 / 150

页数：9

相关论文

共 10 条

[1] BORN M, 1964, PRINCIPLES OPTICS, P464
[2] RONCHI TEST OF ASPHERICAL SURFACES, ANALYSIS, AND ACCURACY
CORNEJO, A
MALACARA, D
[J]. APPLIED OPTICS, 1970, 9 (08): : 1897 - &
[3] A SEMIAUTOMATIC METHOD FOR INTERPRETING SHEARING INTERFEROGRAMS
DUTTON, D
CORNEJO, A
LATTA, M
[J]. APPLIED OPTICS, 1968, 7 (01): : 125 - &
[4] MURTY MVR, 1973, J OPT SOC AM, V63, P1312
[5] LENS TESTING WITH A SIMPLE WAVEFRONT SHEARING INTERFEROMETER
NYYSSONEN, D
JERKE, JM
[J]. APPLIED OPTICS, 1973, 12 (09) : 2061 - 2070
[6] METHOD FOR EVALUATING LATERAL SHEARING INTERFEROGRAMS
RIMMER, MP
[J]. APPLIED OPTICS, 1974, 13 (03): : 623 - 629
[7] 40 YEARS OF HISTORY OF GRATING INTERFEROMETER
RONCHI, V
[J]. APPLIED OPTICS, 1964, 3 (04): : 437 - &
[8] A NEW INTERFEROMETRIC TEST AND ITS APPLICATION TO 84-IN REFLECTING TELESCOPE AT KITT PEAK NATIONAL OBSERVATORY
SAUNDERS, JB
BRUENING, RJ
[J]. ASTRONOMICAL JOURNAL, 1968, 73 (06) : 415 - &
[9] ORTHONORMAL EXPANSION OF ABERRATION DIFFERENCE FUNCTION AND ITS APPLICATION TO IMAGE EVALUATION
SUMITA, H
[J]. JAPANESE JOURNAL OF APPLIED PHYSICS, 1969, 8 (08) : 1027 - &
[10] DOUBLE FREQUENCY GRATING LATERAL SHEAR INTERFEROMETER
WYANT, JC
[J]. APPLIED OPTICS, 1973, 12 (09): : 2057 - 2060