MEASUREMENT OF THE COMPLEX NONLINEAR REFRACTIVE-INDEX OF SINGLE-CRYSTAL P-TOLUENE SULFONATE AT 1064-NM

Z-scan at 1064 nm was used with single, 35 ps pulses to measure the nonlinear refraction and absorption in single crystal PTS (p-toluene sulfonate). Detailed analysis of the Z-scan data based on DELTAn = n2I + n3I2 and DELTAalpha = alpha2I + alpha3I2 yielded n2 = 5(+/-1) X 10(-12) cm2/W, alpha2 = 100(+/-20) cm/GW, n3 = 5(+/-1)X 10(-21) cm4/W2 and alpha3 = - 5 (+/- 1) cm3/GW.2 The resulting two photon figure of merit T for PTS is marginal for high throughput, all-optical waveguide switching at 1064 nm.