FREQUENCY AND FIELD-DEPENDENCE OF THE IRREVERSIBILITY LINE IN A YBA2CU3O7-DELTA FILM

被引：53

作者：

EMMEN, JHPM ^{[1
]}

STOLLMAN, GM ^{[1
]}

DEJONGE, WJM ^{[1
]}

机构：

[1] PHILIPS RES LABS,5600 JA EINDHOVEN,NETHERLANDS

来源：

PHYSICA C | 1990年 / 169卷 / 5-6期

关键词：

D O I：

10.1016/0921-4534(90)90586-4

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

The irreversibility line of an epitaxial YBa2Cu3O7-δ film was determined using AC susceptibility experiments. It is shown that the irreversibility line depends on both the amplitude of the AC field and the measuring frequency. We argue that, therefore this line represents a crossover from pinning to flow regimes. The power law behaviour which is predicted by flux creep is only found in a limited field range and is dependent on hAC. © 1990.

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页码：418 / 424

页数：7

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