SURFACE-STRUCTURE DETERMINATION OF LAYERED COMPOUNDS MOS2 AND NBSE2 BY LOW-ENERGY ELECTRON-DIFFRACTION

被引：51

作者：

MRSTIK, BJ

KAPLAN, R

REINECKE, TL

VANHOVE, M

TONG, SY

机构：

[1] USN RES LAB,WASHINGTON,DC 20375

[2] UNIV WISCONSIN,DEPT PHYS,MILWAUKEE,WI 53201

来源：

PHYSICAL REVIEW B | 1977年 / 15卷 / 02期

关键词：

D O I：

10.1103/PhysRevB.15.897

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

引用

页码：897 / 900

页数：4

共 16 条

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