INFLUENCE OF NONUNIFORMITY ON INFRARED FOCAL PLANE ARRAY PERFORMANCE

被引：190

作者：

MILTON, AF ^{[1
]}

BARONE, FR ^{[1
]}

KRUER, MR ^{[1
]}

机构：

[1] USN, RES LAB, ELECTRO OPT TECHNOL BRANCH, WASHINGTON, DC 20375 USA

来源：

OPTICAL ENGINEERING | 1985年 / 24卷 / 05期

关键词：

ARRAY SENSITIVITY - FOCAL PLANE ARRAY - NONUNIFORMITY CORRECTION - STARING INFRARED FOCAL PLANE ARRAY (IRFPA) - TWO-POINT CALIBRATION;

D O I：

10.1117/12.7973588

中图分类号：

O43 [光学];

学科分类号：

070207 ; 0803 ;

摘要：

It is well known that detector response nonuniformity results in pattern noise with staring sensors that is a severe problem in the infrared due to the low intrinsic contrast of IR imagery. The pattern noise can be corrected by electronic processing; however, the ability to correct for pattern noise is limited by the interaction of interscene and intrascene variability with the dynamic range of the processor (number of bits) and, depending upon the algorithm used, by nonlinearities in the detector response. This paper quantifies these limitations and describes the interaction of detector gain nonuniformity and detector nonlinearities. Probabilistic models are developed to determine the maximum sensitivity that can be obtained using a two-point algorithm to correct a nonlinear response curve over a wide temperature range. Curves that permit a prediction of the noise equivalent differential temperature (NE DELTA T) under varying circumstances are presented.

引用

页码：855 / 862

页数：8