MULTIPLE CRYSTAL SYSTEM FOR HIGH STRAIN SENSITIVITY X-RAY TOPOGRAPHY AND ITS APPLICATIONS

被引:16
作者
HASHIZUME, H [1 ]
IIDA, A [1 ]
KOHRA, K [1 ]
机构
[1] UNIV TOKYO,FAC ENGN,DEPT APPL PHYS,TOKYO 113,JAPAN
关键词
D O I
10.1143/JJAP.14.1433
中图分类号
O59 [应用物理学];
学科分类号
摘要
引用
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页码:1433 / 1441
页数:9
相关论文
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