APPARATUS FOR MEASUREMENT OF ANGLE-RESOLVED SPECTRA OF ELECTRONS EMERGING FROM SINGLE-CRYSTALS

被引：11

作者：

BEST, PE

机构：

[1] UNIV CONNECTICUT,INST MAT SCI,STORRS,CT 06268

[2] UNIV CONNECTICUT,DEPT PHYS,STORRS,CT 06268

来源：

REVIEW OF SCIENTIFIC INSTRUMENTS | 1975年 / 46卷 / 11期

关键词：

D O I：

10.1063/1.1134095

中图分类号：

TH7 [仪器、仪表];

学科分类号：

0804 ; 080401 ; 081102 ;

摘要：

引用

页码：1517 / 1521

页数：5

共 26 条

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[7]

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[10] ANGULAR-DISTRIBUTIONS OF SECONDARY ELECTRONS ORIGINATING FROM THIN-FILMS OF DIFFERENT METALS IN RE-EMISSION AND TRANSMISSION [J].

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OPPEL, W .

JOURNAL OF VACUUM SCIENCE & TECHNOLOGY, 1972, 9 (01) :173-&

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