SCANNING FORCE MICROSCOPIES CAN IMAGE PATTERNED SELF-ASSEMBLED MONOLAYERS

被引：201

作者：

WILBUR, JL ^{[1
]}

BIEBUYCK, HA ^{[1
]}

MACDONALD, JC ^{[1
]}

WHITESIDES, GM ^{[1
]}

机构：

[1] HARVARD UNIV,DEPT CHEM,CAMBRIDGE,MA 02138

来源：

LANGMUIR | 1995年 / 11卷 / 03期

关键词：

D O I：

10.1021/la00003a025

中图分类号：

O6 [化学];

学科分类号：

0703 ;

摘要：

This paper demonstrates that scanning probe microscopies (SPMs) can image patterned self-assembled monolayers (SAMs) formed by microcontact printing. Lateral force microscopy (LFM) and force modulation microscopy (FMM) showed contrast between regions of patterned SAMs terminated by different chemical functionalities. Normal force microscopy (NFM) typically showed less contrast than LFM or FMM but provided information about the topography of the surface. Chemical functionality (at the interface between the SAM and air) dominated imaging in these experiments. Changes in the morphology of the surface or changes in the humidity of the environment for imaging did not influence significantly the contrast in our experiments. The sharpness of the contrast suggests the use of LFM and SAMs in studying tribology on the submicrometer scale.

引用

页码：825 / 831

页数：7

共 26 条

[1] FORMATION OF MONOLAYERS BY THE COADSORPTION OF THIOLS ON GOLD - VARIATION IN THE HEAD GROUP, TAIL GROUP, AND SOLVENT [J].