EXTERNALLY STRAINED SI(100) OBSERVED WITH SCANNING TUNNELING MICROSCOPY

被引:7
作者
PACKARD, WE
DAI, N
DOW, JD
JAKLEVIC, RC
KAISER, WJ
TANG, SL
机构
[1] FORD MOTOR CO,DEARBORN,MI 48121
[2] CALTECH,JET PROP LAB,PASADENA,CA 91109
[3] DUPONT CO,DEPT CENT RES & DEV,EXPT STN,WILMINGTON,DE 19898
来源
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A-VACUUM SURFACES AND FILMS | 1990年 / 8卷 / 04期
关键词
D O I
10.1116/1.576498
中图分类号
TB3 [工程材料学];
学科分类号
0805 ; 080502 ;
摘要
Applying a uniaxial strain to Si(100) lifts the orientational degeneracy of the surface energy for 2X 1 and 1X2 domains, with a corresponding population increase for the favored domains. An external uniaxial strain was applied to Si(100) by pushing or pulling the free end of a long thin cantilevered sample and the resulting domain structure was observed with a scanning tunneling microscope (STM). On externally unstrained Si(100) there were equal populations of 2X1 and 1X2 domains. The STM images show that under strain individual domains of 2 × 1 grew in size at the expense of individual domains of 1X 2, and the pattern on the strained surface was a large majority terrace, a single-atom-high step to a thin minority terrace, followed by a single-atom-high step back to a large majority terrace. The minority domains formed thin terraces which could have meandering directions. Regions of 2X2 reconstruction were frequently observed on the strained surface. © 1990, American Vacuum Society. All rights reserved.
引用
收藏
页码:3512 / 3515
页数:4
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