OPTICAL-RECORDING CHARACTERISTICS OF IMPLANTED TELLURIUM-FILMS

被引:6
作者
BEAUVAIS, J [1 ]
GALARNEAU, P [1 ]
LESSARD, RA [1 ]
机构
[1] UNIV LAVAL,CTR RECH ATOMES & MOLECULES,DEPT PHYS,QUEBEC CITY G1K 7P4,QUEBEC,CANADA
关键词
D O I
10.1016/0040-6090(89)90242-3
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
引用
收藏
页码:47 / 52
页数:6
相关论文
共 11 条
[1]  
BOSCH MA, 1982, APPL PHYS LETT, V40, P8, DOI 10.1063/1.92900
[2]  
BURENKOV AF, 1986, TABLE ION IMPLANTATI
[3]  
KISHINO N, 1985, P SOC PHOTO-OPT INST, V529, P40
[4]  
RYSSEL H, 1982, ION IMPLANTATION TEC, V10, P177
[5]  
SCHIAVONE LM, 1984, OPTICAL SOC AM TECHN, V84
[6]  
SINGH A, 1987, 14TH P INT COMM OPT, V813, P417
[7]  
SINGH A, 1986, ADV SURFACE TREATMEN, V3, P155
[8]   OPTICAL-RECORDING CHARACTERISTICS OF SEGE THIN-FILMS AT LAMBDA = 488-NM [J].
SONG, L ;
GALARNEAU, P ;
LESSARD, RA .
OPTICAL ENGINEERING, 1989, 28 (03) :290-296
[9]  
SONG L, IN PRESS APPL OPT
[10]  
TERAO M, 1985, P SOC PHOTO-OPT INST, V529, P46, DOI 10.1117/12.946430