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APPARATUS FOR MEASURING SEEBECK COEFFICIENTS OF HIGH-RESISTANCE SEMICONDUCTING-FILMS

被引：11
作者：
TRAKALO, M
MOORE, CJ
LESLIE, JD
BRODIE, DE
机构：
来源：
REVIEW OF SCIENTIFIC INSTRUMENTS | 1984年 / 55卷 / 05期
关键词：
D O I：
10.1063/1.1137812
中图分类号：
TH7 [仪器、仪表];
学科分类号：
0804 ; 080401 ; 081102 ;
摘要：
引用
收藏
页码：754 / 760
页数：7
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