ESPI - THE ULTIMATE HOLOGRAPHIC TOOL FOR VIBRATION ANALYSIS

被引:85
作者
LOKBERG, OJ
机构
关键词
D O I
10.1121/1.390979
中图分类号
O42 [声学];
学科分类号
070206 ; 082403 ;
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页码:1783 / 1791
页数:9
相关论文
共 29 条
[1]   TEMPORALLY MODULATED HOLOGRAPHY [J].
ALEKSOFF, CC .
APPLIED OPTICS, 1971, 10 (06) :1329-&
[2]  
Butters J. N., 1971, Optics and Laser Technology, V3, P26, DOI 10.1016/S0030-3992(71)80007-5
[3]   PULSED LASERS IN ELECTRONIC SPECKLE PATTERN INTERFEROMETRY [J].
COOKSON, TJ ;
BUTTERS, JN ;
POLLARD, HC .
OPTICS AND LASER TECHNOLOGY, 1978, 10 (03) :119-124
[4]  
Erf R. K., 1978, SPECKLE METROLOGY
[5]  
ERF RK, 1974, HOLOGRAPIC NONDESTRU
[6]   MEASUREMENT OF FAN VIBRATION USING DOUBLE PULSE-HOLOGRAPHY [J].
HOCKLEY, BS ;
FORD, RAJ ;
FOORD, CA .
JOURNAL OF ENGINEERING FOR POWER-TRANSACTIONS OF THE ASME, 1978, 100 (04) :655-663
[7]   DETECTION AND MEASUREMENT OF SMALL VIBRATIONS USING ELECTRONIC SPECKLE PATTERN INTERFEROMETRY [J].
HOGMOEN, K ;
LOKBERG, OJ .
APPLIED OPTICS, 1977, 16 (07) :1869-1875
[8]  
Huignard J. P., 1980, Proceedings of the Society of Photo-Optical Instrumentation Engineers, V215, P178
[9]   VIBRATION MODE ANALYSIS USING ELECTRONIC SPECKLE PATTERN INTERFEROMETRY [J].
HURDEN, APM .
OPTICS AND LASER TECHNOLOGY, 1982, 14 (01) :21-25
[10]   SEMIAUTOMATIC MEASUREMENTS OF SMALL HIGH-FREQUENCY VIBRATIONS USING TIME AVERAGED ELECTRONIC SPECKLE PATTERN INTERFEROMETRY [J].
KOYUNCU, B ;
COOKSON, J .
JOURNAL OF PHYSICS E-SCIENTIFIC INSTRUMENTS, 1980, 13 (02) :206-208