IN-VIVO OPTOTHERMAL MEASUREMENT OF EPIDERMAL THICKNESS

被引：18

作者：

BINDRA, RMS ^{[1
]}

IMHOF, RE ^{[1
]}

ECCLESTON, GM ^{[1
]}

机构：

[1] UNIV STRATHCLYDE,DEPT PHARMACOL SCI,GLASGOW G4 0NG,LANARK,SCOTLAND

来源：

JOURNAL DE PHYSIQUE IV | 1994年 / 4卷 / C7期

关键词：

D O I：

10.1051/jp4:19947103

中图分类号：

O4 [物理学];

学科分类号：

0702 ;

摘要：

We report a new opto-thermal method of measuring epidermal thickness in-vivo, using thermal waves generated within the epidermis which reach the surface after transit delays that depend on depth. The method is illustrated with a thickness map of a forearm, a tape stripping sequence and subsequent wound healing.

引用

页码：445 / 448

页数：4

共 4 条

[1] OPTO-THERMAL INVIVO MONITORING OF SUNSCREENS ON SKIN [J].

IMHOF, RE ;

WHITTERS, CJ ;

BIRCH, DJS .

PHYSICS IN MEDICINE AND BIOLOGY, 1990, 35 (01) :95-102

[2] PULSED PHOTOTHERMAL RADIOMETRY FOR DEPTH PROFILING OF LAYERED MEDIA [J].

LONG, FH ;

ANDERSON, RR ;

DEUTSCH, TF .

APPLIED PHYSICS LETTERS, 1987, 51 (25) :2076-2078

[3]

NELSON JS, 1992, SPIE, V1643, P287

[4] REMOTE-SENSING APPLICATIONS OF PULSED PHOTOTHERMAL RADIOMETRY [J].

TAM, AC ;

SULLIVAN, B .

APPLIED PHYSICS LETTERS, 1983, 43 (04) :333-335

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