COSMIC-RAY INDUCED PERMANENT DAMAGE IN MNOS EAROMS

被引:13
作者
BLANDFORD, JT [1 ]
WASKIEWICZ, AE [1 ]
PICKEL, JC [1 ]
机构
[1] ROCKWELL INT CORP,ANAHEIM,CA 92803
关键词
D O I
10.1109/TNS.1984.4333551
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
引用
收藏
页码:1568 / 1570
页数:3
相关论文
共 4 条
[1]   HEAVY-ION INDUCED SINGLE EVENT UPSETS IN A BIPOLAR LOGIC DEVICE [J].
KOLASINSKI, WA ;
KOGA, R ;
CHENETTE, DL .
IEEE TRANSACTIONS ON NUCLEAR SCIENCE, 1983, 30 (06) :4470-4474
[2]   SIMULATION OF COSMIC-RAY INDUCED SOFT ERRORS AND LATCHUP IN INTEGRATED-CIRCUIT COMPUTER MEMORIES [J].
KOLASINSKI, WA ;
BLAKE, JB ;
ANTHONY, JK ;
PRICE, WE ;
SMITH, EC .
IEEE TRANSACTIONS ON NUCLEAR SCIENCE, 1979, 26 (06) :5087-5091
[3]  
PICKEL JC, 1980, IEEE T NUCL SCI, V27, P2675
[4]  
PICKEL JC, 1983, DNATR81259