SEMIMETALLIC CHARACTER OF TISE2 AND SEMICONDUCTOR CHARACTER OF TIS2 UNDER PRESSURE

被引：91

作者：

FRIEND, RH

JEROME, D

LIANG, WY

MIKKELSEN, JC

YOFFE, AD

机构：

[1] UNIV PARIS 11,PHYS SOLIDES LAB,F-91405 ORSAY,FRANCE

[2] XEROX CORP,PALO ALTO RES CTR,PALO ALTO,CA 94304

来源：

JOURNAL OF PHYSICS C-SOLID STATE PHYSICS | 1977年 / 10卷 / 24期

关键词：

D O I：

10.1088/0022-3719/10/24/006

中图分类号：

O469 [凝聚态物理学];

学科分类号：

070205 ;

摘要：

引用

页码：L705 / L708

页数：4

共 25 条

[1] ANGLE-RESOLVED PHOTOEMISSION FROM TISE2 USING SYNCHROTRON RADIATION [J].

BACHRACH, RZ ;

SKIBOWSKI, M ;

BROWN, FC .

PHYSICAL REVIEW LETTERS, 1976, 37 (01) :40-42

[2] OPTICAL, ELECTRICAL-TRANSPORT, AND HEAT-CAPACITY STUDIES OF SOLID-SOLUTIONS TIXTA1-XS2, ZRXTA1-XS2, AND TIXNB1-XSE2 [J].

BENDA, JA .

PHYSICAL REVIEW B, 1974, 10 (04) :1409-1420

[3]

CHIANELLI RR, 1976, SUPERIONIC CONDUCTOR, P426

[4] HIGH HYDROSTATIC-PRESSURE EQUIPMENT UP TO 40 KBAR FOR LOW-TEMPERATURE MEASUREMENTS 500K GREATER-THAN T GREATER-THAN 1.4K [J].

DELAPLACE, R ;

MALFAIT, G ;

JEROME, D .

REVUE DE PHYSIQUE APPLIQUEE, 1976, 11 (02) :327-335

[5]

DELAPLACE R, 1976, REV PHYS APPL, V11, P426

[6] ELECTRONIC PROPERTIES AND SUPERLATTICE FORMATION IN SEMIMETAL TISE2 [J].

DISALVO, FJ ;

MONCTON, DE ;

WASZCZAK, JV .

PHYSICAL REVIEW B, 1976, 14 (10) :4321-4328

[7] ELECTRONIC GROUND-STATE OF LAYER COMPOUNDS ZRS2, TIS2 AND TISE2 [J].

ISOMAKI, H ;

VONBOEHM, J ;

KRUSIUS, P .

NUOVO CIMENTO DELLA SOCIETA ITALIANA DI FISICA B-GENERAL PHYSICS RELATIVITY ASTRONOMY AND MATHEMATICAL PHYSICS AND METHODS, 1977, 38 (02) :168-175

[8] SELF-CONSISTENT ELECTRONIC-SPECTRUM OF LAYER CRYSTAL TIS2 [J].

KRUSIUS, P ;

BOEHM, JV ;

ISOMAKI, H .

JOURNAL OF PHYSICS C-SOLID STATE PHYSICS, 1975, 8 (22) :3788-3800

[9] ELECTRON-HOLE SCATTERING AND ELECTRICAL-RESISTIVITY OF SEMIMETAL TIS2 [J].

KUKKONEN, CA ;

MALDAGUE, PF .

PHYSICAL REVIEW LETTERS, 1976, 37 (12) :782-785

[10]

MALFAIT G, 1969, REV PHYS APPL, V4, P467

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