BREAKDOWN OF A THIN DIELECTRIC LIQUID LAYER

被引:4
作者
BROSSEAU, C
机构
[1] CERMO, Université Joseph Fourier, Saint-Martin-d’Hères Cedex
来源
IEEE TRANSACTIONS ON ELECTRICAL INSULATION | 1992年 / 27卷 / 06期
关键词
D O I
10.1109/14.204875
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
This work concerns measurements of electrical breakdown on thin (10 mum to 100 mum) liquid dielectric (capacitor impregnant) layers for different interfacial situations. For this purpose a new uniform field electrode arrangement which represents interfacial conditions close to those of the industrial practice has been developed. It has been investigated experimentally how the dielectric strength depends on various factors such as electrode area, gap spacing, nature of the interface in contact with the liquid, and temperature. The breakdown phenomena are shown to be related either to high-field conduction (i.e. boiling or electrohydrodynamic cavitation leading to the generation of a vapor bubble in the prebreakdown regime), or related to the presence of particles or to local field enhancements.
引用
收藏
页码:1217 / 1223
页数:7
相关论文
共 15 条
[1]  
ABED Y, 1970, THESIS WROCLAW U WRO
[2]  
ABED Y, 1970, PRACE NAUKOWE I PODS, V1, P56
[3]   ELECTRICAL-CONDUCTION IN IMPREGNANTS FOR ALL-FILM POWER CAPACITORS [J].
BROSSEAU, C .
JOURNAL OF APPLIED PHYSICS, 1991, 70 (10) :5544-5554
[4]  
BROSSEAU C, 1991, PROCEEDINGS OF THE 3RD INTERNATIONAL CONFERENCE ON PROPERTIES AND APPLICATIONS OF DIELECTRIC MATERIALS, VOLS 1 AND 2, P848, DOI 10.1109/ICPADM.1991.172200
[5]   INTERFACE INFLUENCE ON THE HIGH-FIELD CONDUCTION PHENOMENA OF A THIN DIELECTRIC LIQUID LAYER [J].
BROSSEAU, C .
JOURNAL OF APPLIED PHYSICS, 1991, 69 (02) :891-895
[6]  
BROSSEAU C, 1989, THESIS FOURIER GRENO
[7]   PROGRESS IN THE FIELD OF ELECTRICAL BREAKDOWN IN DIELECTRIC FLUIDS [J].
FORSTER, EO .
IEEE TRANSACTIONS ON ELECTRICAL INSULATION, 1985, 20 (06) :905-912
[8]   THE EFFECT OF MOLECULAR-STRUCTURE ON THE PROPERTIES OF DIELECTRIC FLUIDS [J].
FORSTER, EO ;
MAZZETTI, C ;
POMPILI, M ;
CECERE, R .
IEEE TRANSACTIONS ON ELECTRICAL INSULATION, 1991, 26 (04) :749-754
[9]  
FORSTER EO, 1990, J PHYS D, V23, P1516
[10]  
GALLAGHER TJ, 1975, SIMPLE DIELECTRIC LI, pCH3