NEAR-FIELD MEASUREMENTS OF SUBNANOSECOND-CREATED LASER PLASMAS

被引:16
作者
OLSEN, JN [1 ]
MENDEL, CW [1 ]
机构
[1] SANDIA LABS,ALBUQUERQUE,NM 87115
关键词
D O I
10.1063/1.321468
中图分类号
O59 [应用物理学];
学科分类号
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页码:4407 / 4415
页数:9
相关论文
共 19 条
[1]   MICROSCOPIC INTERFEROMETRY OF LASER-PRODUCED PLASMAS [J].
ATTWOOD, DT ;
COLEMAN, LW .
APPLIED PHYSICS LETTERS, 1974, 24 (09) :408-410
[2]  
BYKOVSKII YA, 1971, SOV PHYS TECH PHYS-U, V15, P2020
[3]  
CANO GL, 1974, B AM PHYS SOC, V19, P886
[4]   X-RAY SPECTROMETER FOR LASER-INDUCED PLASMAS [J].
CUDERMAN, JF ;
GLIBERT, KM .
REVIEW OF SCIENTIFIC INSTRUMENTS, 1975, 46 (01) :53-57
[5]   OBSERVATIONS OF PICOSECOND X-RAY PULSES [J].
DUGUAY, MA ;
OLSEN, JN .
IEEE JOURNAL OF QUANTUM ELECTRONICS, 1975, QE11 (04) :170-172
[6]  
EHLER AW, 7TH EUR C PLASM PROD
[7]  
Goodman J. W., 2005, INTRO FOURIER OPTICS
[8]  
JONES RB, COMMUNICATION
[9]  
KEPHART JF, 1974, B AM PHYS SOC, V19, P886
[10]  
KOHLER D, 1974, B AM PHYS SOC, V19, P854