A HIGH-RESOLUTION WIRE SCANNER FOR MICRON-SIZE PROFILE MEASUREMENTS AT THE SLC

被引:27
作者
FULTON, R
HAGGERTY, J
JARED, R
JONES, R
KADYK, J
FIELD, C
KOZANECKI, W
KOSKA, W
机构
[1] STANFORD UNIV,STANFORD LINEAR ACCELERATOR CTR,STANFORD,CA 94305
[2] UNIV MICHIGAN,ANN ARBOR,MI 48109
关键词
D O I
10.1016/0168-9002(89)90362-8
中图分类号
TH7 [仪器、仪表];
学科分类号
0804 ; 080401 ; 081102 ;
摘要
引用
收藏
页码:37 / 44
页数:8
相关论文
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