FIELD-EMISSION SCANNING AUGER MICROSCOPE (FESAM)

被引：50

作者：

REIHL, B

GIMZEWSKI, JK

机构：

来源：

关键词：

D O I：

10.1016/S0039-6028(87)80412-0

中图分类号：

O64 [物理化学（理论化学）、化学物理学];

学科分类号：

070304 ; 081704 ;

摘要：

引用

页码：36 / 43

页数：8

共 15 条

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SMITH, DPE
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[3] BINNIG G, 1986, IBM J RES DEV, V30, P353
[4] DIGITAL SCANNING AUGER-ELECTRON MICROSCOPE INCORPORATING A CONCENTRIC HEMISPHERICAL ANALYZER
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ELGOMATI, MM
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[6] GASSER M, 1987, IBM TECH DISCL B, V30, P8881
[7] SCANNING TUNNELING MICROSCOPE COMBINED WITH A SCANNING ELECTRON-MICROSCOPE
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[8] ELECTRON FIELD-EMISSION FROM FERROMAGNETIC EUROPIUM SULFIDE ON TUNGSTEN
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[J]. PHYSICAL REVIEW B, 1978, 18 (05): : 2256 - 2275
[9] AN IMPORTANT STEP IN QUANTITATIVE AUGER ANALYSIS - THE USE OF PEAK TO BACKGROUND RATIO
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[J]. SURFACE SCIENCE, 1984, 138 (2-3) : 610 - 628
[10] HIGH-RESOLUTION, LOW-VOLTAGE PROBES FROM A FIELD-EMISSION SOURCE CLOSE TO THE TARGET PLANE
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PEASE, RFW
[J]. JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B, 1985, 3 (01): : 198 - 201