OPTOELECTROCHEMICAL STUDY OF MINORITY CHARGE-CARRIERS IN YSZ

被引：16

作者：

NICOLOSO, N

LOBERT, A

WEPPNER, W

RABENAU, A

机构：

[1] Max-Planck-Institut für Festkörperforschung, D-7000 Stuttgart 80

来源：

SOLID STATE IONICS | 1990年 / 40-1卷

关键词：

D O I：

10.1016/0167-2738(90)90350-Z

中图分类号：

O64 [物理化学（理论化学）、化学物理学];

学科分类号：

070304 ; 081704 ;

摘要：

Minority charge carrier trapping in single crystal YSZ has been investigated at high temperature (T≤900°C) by simultaneous electrochemical and optical studies. The results are supported by magnetic measurements at RT. Electron injection into the Pt/ YSZ interface is accompanied by valence changes of impurity ions, especially rare earth ions, and the formation of an intrinsic, colour centre, or polaron-like state. The concentration and mobility of these defects have been determined at different stages of reduction of YSZ. Their relevance for the exchange reaction between O2 and Pt/YSZ is discussed. © 1990.

引用

页码：320 / 323

页数：4

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