COMPOUND MODULATED SCATTERER MEASURING SYSTEM

被引：13

作者：

HAJNAL, JV ^{[1
]}

机构：

[1] UNIV BRISTOL,HH WILLS PHYS LAB,BRISTOL BS8 1TL,AVON,ENGLAND

来源：

关键词：

D O I：

10.1049/ip-h-2.1987.0069

中图分类号：

O43 [光学];

学科分类号：

070207 ; 0803 ;

摘要：

ELECTRIC MEASURING INSTRUMENTS

引用

页码：350 / 356

页数：7

共 9 条

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HAJNAL, JV .

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