MICRO-PARTICLE DETECTION IN AN ELECTRICALLY STRESSED VACUUM GAP

被引：5

作者：

SMALLEY, J ^{[1
]}

机构：

[1] CENT ELECT GENERATING BOARD, MARCHWOOD ENGN LABS, SOUTHAMPTON, HAMPSHIRE, ENGLAND

来源：

关键词：

D O I：

10.1088/0022-3727/9/16/010

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

引用

页码：2397 / +

页数：1

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[8]

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