ANALYSIS OF LOW-FREQUENCY NOISE-REDUCTION BY AUTOZERO TECHNIQUE

被引：21

作者：

ENZ, C

机构：

[1] Swiss Federal Inst of Technology,, Electronics Lab, Lausanne, Switz, Swiss Federal Inst of Technology, Electronics Lab, Lausanne, Switz

来源：

ELECTRONICS LETTERS | 1984年 / 20卷 / 23期

关键词：

D O I：

10.1049/el:19840652

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

This letter analyzes the low-frequency noise reduction produced by the autozero technique. A simple model is established, and the output average power spectrum in the case of lowpass filtered white noise and l/f noise is calculated. This analysis shows the limitation to low-frequency noise reduction introduced by the foldover effect.

引用

页码：959 / 960

页数：2

共 5 条

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[2]

HSIEH KC, 1981, IEEE J SOLID-ST CIRC, V16, P708

[3] MICROPOWER SWITCHED CAPACITOR BIQUADRATIC CELL [J].

KRUMMENACHER, F .

IEEE JOURNAL OF SOLID-STATE CIRCUITS, 1982, 17 (03) :507-512

[4]

LIOU ML, 1979, IEEE T CIRCUITS SYST, V26, P213, DOI 10.1109/TCS.1979.1084633

[5] CHARACTERIZATION OF SURFACE CHANNEL CCD IMAGE ARRAYS AT LOW LIGHT LEVELS [J].

WHITE, MH ;

LAMPE, DR ;

BLAHA, FC ;

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IEEE JOURNAL OF SOLID-STATE CIRCUITS, 1974, SC 9 (01) :1-13

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