AN INSERTION LOSS PHASE AND DELAY MEASURING SET FOR CHARACTERIZING TRANSISTORS AND 2-PORT NETWORKS BETWEEN 0.25 AND 4.2 GC

被引：9

作者：

LEED, D

机构：

来源：

BELL SYSTEM TECHNICAL JOURNAL | 1966年 / 45卷 / 03期

关键词：

D O I：

10.1002/j.1538-7305.1966.tb04215.x

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

引用

页码：397 / +

共 11 条

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LEED, D
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[3] GOLDMAN S, 1948, FREQUENCY ANALYSIS M, P246
[4] A LOSS AND PHASE SET FOR MEASURING TRANSISTOR PARAMETERS AND 2-PORT NETWORKS BETWEEN 5 AND 250 MC
LEED, D
KUMMER, O
[J]. BELL SYSTEM TECHNICAL JOURNAL, 1961, 40 (03): : 841 - +
[5] LEED D, 1948, Patent No. 2610297
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