MEASUREMENT OF SURFACE DISPLACEMENT NORMAL TO LINE OF SIGHT

被引：27

作者：

DUFFY, DE

机构：

[1] HONEYWELL INFORMATION SYST,OKLAHOMA CITY,OK 73112

[2] GE,ELECTR LAB,SYRACUSE,NY

来源：

EXPERIMENTAL MECHANICS | 1974年 / 14卷 / 09期

关键词：

D O I：

10.1007/BF02323565

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

引用

页码：378 / 384

页数：7

共 8 条

[1] RECORDING OF IN-PLANE SURFACE DISPLACEMENT BY DOUBLE-EXPOSURE SPECKLE PHOTOGRAPHY [J].

ARCHBOLD, E ;

BURCH, JM ;

ENNOS, AE .

OPTICA ACTA, 1970, 17 (12) :883-&

[2] MOIRE GAUGING USING OPTICAL INTERFERENCE PATTERNS [J].

BROOKS, RE ;

HEFLINGER, LO .

APPLIED OPTICS, 1969, 8 (05) :935-+

[3] PRODUCTION OF MULTIPLE BEAM FRINGES FROM PHOTOGRAPHIC SCATTERERS [J].

BURCH, JM ;

TOKARSKI, JM .

OPTICA ACTA, 1968, 15 (02) :101-&

[4] DOUBLE EXPOSURE TECHNIQUE FOR SPECKLE PATTERN INTERFEROMETRY [J].

BUTTERS, JN ;

LEENDERTZ, JA .

JOURNAL OF PHYSICS E-SCIENTIFIC INSTRUMENTS, 1971, 4 (04) :277-+

[5]

Cook R. W. E., 1971, Optics and Laser Technology, V3, P71, DOI 10.1016/0030-3992(71)90039-9

[6] MOIRE GAUGING OF IN-PLANE DISPLACEMENT USING DOUBLE APERTURE IMAGING [J].

DUFFY, DE .

APPLIED OPTICS, 1972, 11 (08) :1778-&

[7] MEASUREMENT OF IN-PLANE SURFACE STRAIN BY HOLOGRAM INTERFEROMETRY [J].

ENNOS, AE .

JOURNAL OF PHYSICS E-SCIENTIFIC INSTRUMENTS, 1968, 1 (07) :731-&

[8] ANALYSIS OF MECHANICAL OSCILLATIONS BY SPECKLING [J].

TIZIANI, HJ .

APPLIED OPTICS, 1972, 11 (12) :2911-&

← 1 →