OPTICAL-PROPERTIES OF VANADIUM THIN-FILMS

被引：6

作者：

FOUAD, SS ^{[1
]}

ELFAZARY, MH ^{[1
]}

ELSHAZLY, AA ^{[1
]}

SHARAF, F ^{[1
]}

NASSR, KM ^{[1
]}

机构：

[1] SUEZ CANAL UNIV,FAC SCI,ISMAILIA,EGYPT

来源：

JOURNAL OF MATERIALS SCIENCE | 1991年 / 26卷 / 21期

关键词：

D O I：

10.1007/BF01130123

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

The optical constants of vanadium thin films of different thicknesses were determined in the spectral range of 2.5 to 8.5-mu-m. These optical constants were used to evaluate some microcharacteristics of vanadium thin films such as the free charge concentration, the relaxation time, the static conductivity, the electron velocity at the Fermi surface, the mean free path and the specularity parameter. The determination of the microcharacteristics were carried out in conjunction with Drude's theory of free charge carriers as well as with anomalous skin effect theory.

引用

页码：5843 / 5847

页数：5