XAFS WITH AN ENERGY-DISPERSIVE LAUE MONOCHROMATOR

被引：9

作者：

HAGELSTEIN, M ^{[1
]}

FERRERO, C ^{[1
]}

DELRIO, MS ^{[1
]}

HATJE, U ^{[1
]}

RESSLER, T ^{[1
]}

METZ, W ^{[1
]}

机构：

[1] UNIV HAMBURG, D-20146 HAMBURG, GERMANY

来源：

PHYSICA B | 1995年 / 208卷 / 1-4期

关键词：

D O I：

10.1016/0921-4526(94)00838-M

中图分类号：

O469 [凝聚态物理学];

学科分类号：

070205 ;

摘要：

A Laue-type curved monochromator has been used for the first time for energy-dispersive XAFS spectroscopy on a synchrotron beam line. Experiments at the Pd K-edge at 24.35 keV photon energy have been performed at the DEXAFS/HASYLAB station. The quality of the XAFS spectra proved to be superior to spectra measured with silicon crystals in the dispersive Bragg geometry. In this case an asymmetric broadening of the reflectivity profile leads to strong distortions of the near edge fine structure and a reduction in the spectral resolution. XAFS spectra measured in the Laue and Bragg geometry are compared. The reflectivity profiles have been calculated using the dynamical theory.

引用

页码：223 / 224

页数：2

共 4 条

[1] THEORETICAL REFLECTIVITIES OF BENT CRYSTAL ANALYZERS FOR FUSION PLASMA DIAGNOSTICS [J].