MEASURING SURFACE VARIATIONS WITH SCANNING ELECTRON-MICROSCOPE USING LINES OF EVAPORATED METAL

被引:4
作者
SWIFT, JA [1 ]
机构
[1] UNILEVER RES ISLEWORTH LAB,ISLEWORTH TW7 5AB,MIDDLESEX,ENGLAND
来源
JOURNAL OF PHYSICS E-SCIENTIFIC INSTRUMENTS | 1976年 / 9卷 / 10期
关键词
D O I
10.1088/0022-3735/9/10/002
中图分类号
TH7 [仪器、仪表];
学科分类号
0804 ; 080401 ; 081102 ;
摘要
引用
收藏
页码:803 / 804
页数:2
相关论文
共 4 条
[1]  
BISHOP HE, 1966, THESIS U CAMBRIDGE
[2]  
BOYDE A, 1974, SCANNING ELECT MICRO, P277
[3]   MEASURING SURFACE VARIATIONS WITH SCANNING ELECTRON MICROSCOPE USING DEPOSITED CONTAMINATION LINES [J].
HOOVER, RA .
JOURNAL OF PHYSICS E-SCIENTIFIC INSTRUMENTS, 1971, 4 (10) :747-&
[4]  
Mckay KG., 1948, ADV ELECTRON, V1, P65