LOW-TEMPERATURE PROPERTIES AND LOCALIZATION EFFECTS IN AMORPHOUS THIN-FILMS OF W-RE

被引：14

作者：

RAFFY, H ^{[1
]}

LAIBOWITZ, RB ^{[1
]}

机构：

[1] IBM CORP,THOMAS J WATSON RES CTR,YORKTOWN HTS,NY 10598

来源：

PHYSICAL REVIEW B | 1984年 / 30卷 / 10期

关键词：

D O I：

10.1103/PhysRevB.30.5541

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

引用

页码：5541 / 5551

页数：11

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