TESTS OF WIRE CHAMBER AGING WITH CF4 ISOBUTANE (80-20), ARGON ETHANE (50-50), AND ARGON ETHANE CF4 (48-48-4)

被引：26

作者：

OPENSHAW, R ^{[1
]}

HENDERSON, R ^{[1
]}

FASZER, W ^{[1
]}

MURPHY, D ^{[1
]}

SALOMON, M ^{[1
]}

SHEFFER, G ^{[1
]}

机构：

[1] UNIV MELBOURNE,PARKVILLE,VIC 3052,AUSTRALIA

来源：

IEEE TRANSACTIONS ON NUCLEAR SCIENCE | 1989年 / 36卷 / 01期

关键词：

D O I：

10.1109/23.34502

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

引用

页码：567 / 571

页数：5

共 11 条

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[2]

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[3]

HENDERSON, 1988, IEEE T NUCL SCI, V34, P477

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[5]

HESS DW, 1986, WORKSHOP RAD DAMAGE, P15

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[8] Thin film field emission [J].

Malter, L .

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[9] REVIEW OF WIRE CHAMBER AGING [J].

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[10]

YVERT, 1986, P WORKSHOP RAD DAMAG

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