X-RAY MICROTOMOGRAPHY ON BEAMLINE-X AT SSRL

被引：29

作者：

KINNEY, JH

JOHNSON, QC

NICHOLS, MC

BONSE, U

SAROYAN, RA

NUSSHARDT, R

PAHL, R

机构：

来源：

REVIEW OF SCIENTIFIC INSTRUMENTS | 1989年 / 60卷 / 07期

关键词：

D O I：

10.1063/1.1140702

中图分类号：

TH7 [仪器、仪表];

学科分类号：

0804 ; 080401 ; 081102 ;

摘要：

引用

页码：2471 / 2474

页数：4

共 16 条

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[10] ENERGY-MODULATED X-RAY MICROTOMOGRAPHY [J].

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