TEMPERATURE JUMP IN ELECTRIC DOUBLE-LAYER STUDY .1. METHOD OF MEASUREMENTS

被引:90
作者
BENDERSKII, VA
VELICHKO, GI
机构
来源
JOURNAL OF ELECTROANALYTICAL CHEMISTRY | 1982年 / 140卷 / 01期
关键词
D O I
10.1016/0368-1874(82)85295-7
中图分类号
O65 [分析化学];
学科分类号
070302 ; 081704 ;
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页码:1 / 22
页数:22
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