INFLUENCE OF SPECIMEN TOPOGRAPHY ON X-RAY MICROANALYSIS ELEMENT MAPPING

被引：15

作者：

HESS, FD ^{[1
]}

FALK, RH ^{[1
]}

BAYER, DE ^{[1
]}

机构：

[1] UNIV CALIF, DEPT BOT, DAVIS, CA 95616 USA

来源：

AMERICAN JOURNAL OF BOTANY | 1975年 / 62卷 / 03期

关键词：

D O I：

10.2307/2441858

中图分类号：

Q94 [植物学];

学科分类号：

071001 ;

摘要：

引用

收藏

页码：246 / 253

页数：8

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