A 3-RATIO SCHEME FOR THE MEASUREMENT OF ISOTOPIC-RATIOS OF SILICON

被引：10

作者：

KU, H

SCHAEFER, F

VALKIERS, S

DEBIEVRE, P

机构：

[1] COMMISS EUROPEAN COMMUNITIES, INST REFERENCE MAT & MEASUREMENTS, B-2400 GEEL, BELGIUM

[2] UNIV BREMEN, W-2800 BREMEN 33, GERMANY

[3] HIK TECH COLL, GEEL, BELGIUM

[4] STATE UNIV GHENT, B-9000 GHENT, BELGIUM

[5] UNIV INSTELLING ANTWERP, B-2610 WILRIJK, BELGIUM

来源：

JOURNAL OF RESEARCH OF THE NATIONAL INSTITUTE OF STANDARDS AND TECHNOLOGY | 1993年 / 98卷 / 02期

关键词：

ATOMIC WEIGHT OF SILICON; ISOTOPE RATIOS; MASS SPECTROMETER; MEASUREMENT SCHEME; REDUNDANCY; SYMMETRY;

D O I：

10.6028/jres.098.017

中图分类号：

TH7 [仪器、仪表];

学科分类号：

0804 ; 080401 ; 081102 ;

摘要：

This paper proposes a scheme of measurement sequences that has been used for the redetermination of the molar mass (atomic weight) of silicon at the Central Bureau for Nuclear Measurements (now Institute for Reference Materials and Measurements). This scheme avoids correlations among the measured ratios caused by normalizing all ion current measurements to that of the largest ion current. It also provides additional information for checking on the consistency of these ratios within a cycle of scans. Measurements of isotope abundance ratios of silicon are used as an illustration.

引用

页码：225 / 229

页数：5