ACCURATE LATTICE-CONSTANTS FROM MULTIPLE DIFFRACTION MEASUREMENTS .1. GEOMETRY, TECHNIQUES AND SYSTEMATIC-ERRORS

被引：44

作者：

POST, B ^{[1
]}

机构：

[1] POLYTECH INST NEW YORK,BROOKLYN,NY 11201

来源：

JOURNAL OF APPLIED CRYSTALLOGRAPHY | 1975年 / 8卷 / AUG1期

关键词：

D O I：

10.1107/S0021889875010953

中图分类号：

O6 [化学];

学科分类号：

0703 ;

摘要：

引用

页码：452 / 456

页数：5

共 17 条

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[7]

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[8] DIVERGENT-BEAM X-RAY PHOTOGRAPHY OF CRYSTALS [J].

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[9]

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[10] EFFECTS OF SIMULTANEOUS REFLECTIONS ON SINGLE-CRYSTAL NEUTRON DIFFRACTION INTENSITIES [J].

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