QUANTITATIVE SIMS ANALYSIS OF GSJ ROCK REFERENCE SAMPLES

[1] SOLAR-SYSTEM ABUNDANCES OF THE ELEMENTS [J]. GEOCHIMICA ET COSMOCHIMICA ACTA, 1982, 46 (11) : 2363 - 2380

[2] 1988 VALUES FOR GSJ ROCK REFERENCE SAMPLES, IGNEOUS ROCK SERIES [J]. GEOCHEMICAL JOURNAL, 1989, 23 (03) : 143 - 148

[3] SUPPRESSION OF MOLECULAR-IONS IN THE SECONDARY ION MASS-SPECTRA OF MINERALS [J]. SURFACE AND INTERFACE ANALYSIS, 1983, 5 (05) : 181 - 185

[4] QUANTITATIVE MAJOR-ELEMENT AND TRACE-ELEMENT WHOLE-ROCK ANALYSES BY SECONDARY-ION MASS-SPECTROMETRY USING THE SPECIMEN ISOLATION TECHNIQUE [J]. CHEMICAL GEOLOGY, 1986, 55 (1-2) : 139 - 160

[5] QUANTITATIVE-ANALYSIS OF SILICATES BY ION MICRO-PROBE [J]. INTERNATIONAL JOURNAL OF MASS SPECTROMETRY AND ION PROCESSES, 1982, 44 (3-4): : 231 - 255

[6] REED SBJ, 1984, SCANNING ELECTRON MI, V11, P529

[7] ION MICROPROBE DETERMINATION OF RARE-EARTH ELEMENTS IN ACCESSORY MINERALS [J]. MINERALOGICAL MAGAZINE, 1986, 50 (355) : 3 - 15

[8] SECONDARY-ION YIELDS OF RARE-EARTHS [J]. INTERNATIONAL JOURNAL OF MASS SPECTROMETRY AND ION PROCESSES, 1983, 54 (1-2): : 31 - 40

[9] APPLICATIONS OF THE ION MICRO-PROBE TO GEOCHEMISTRY AND COSMOCHEMISTRY [J]. ANNUAL REVIEW OF EARTH AND PLANETARY SCIENCES, 1982, 10 : 483 - 526

[10] GEOCHEMICAL APPLICATIONS OF QUANTITATIVE ION-MICROPROBE ANALYSIS [J]. GEOCHIMICA ET COSMOCHIMICA ACTA, 1978, 42 (09) : 1321 - 1334

[1] SOLAR-SYSTEM ABUNDANCES OF THE ELEMENTS [J]. GEOCHIMICA ET COSMOCHIMICA ACTA, 1982, 46 (11) : 2363 - 2380

[2] 1988 VALUES FOR GSJ ROCK REFERENCE SAMPLES, IGNEOUS ROCK SERIES [J]. GEOCHEMICAL JOURNAL, 1989, 23 (03) : 143 - 148

[3] SUPPRESSION OF MOLECULAR-IONS IN THE SECONDARY ION MASS-SPECTRA OF MINERALS [J]. SURFACE AND INTERFACE ANALYSIS, 1983, 5 (05) : 181 - 185

[4] QUANTITATIVE MAJOR-ELEMENT AND TRACE-ELEMENT WHOLE-ROCK ANALYSES BY SECONDARY-ION MASS-SPECTROMETRY USING THE SPECIMEN ISOLATION TECHNIQUE [J]. CHEMICAL GEOLOGY, 1986, 55 (1-2) : 139 - 160

[5] QUANTITATIVE-ANALYSIS OF SILICATES BY ION MICRO-PROBE [J]. INTERNATIONAL JOURNAL OF MASS SPECTROMETRY AND ION PROCESSES, 1982, 44 (3-4): : 231 - 255

[6] REED SBJ, 1984, SCANNING ELECTRON MI, V11, P529

[7] ION MICROPROBE DETERMINATION OF RARE-EARTH ELEMENTS IN ACCESSORY MINERALS [J]. MINERALOGICAL MAGAZINE, 1986, 50 (355) : 3 - 15

[8] SECONDARY-ION YIELDS OF RARE-EARTHS [J]. INTERNATIONAL JOURNAL OF MASS SPECTROMETRY AND ION PROCESSES, 1983, 54 (1-2): : 31 - 40

[9] APPLICATIONS OF THE ION MICRO-PROBE TO GEOCHEMISTRY AND COSMOCHEMISTRY [J]. ANNUAL REVIEW OF EARTH AND PLANETARY SCIENCES, 1982, 10 : 483 - 526

[10] GEOCHEMICAL APPLICATIONS OF QUANTITATIVE ION-MICROPROBE ANALYSIS [J]. GEOCHIMICA ET COSMOCHIMICA ACTA, 1978, 42 (09) : 1321 - 1334