EFFECT OF SURFACE-ROUGHNESS ON BREAKDOWN IN SF6

被引：59

作者：

PEDERSEN, A ^{[1
]}

机构：

[1] TECH UNIV LYNGBY,DEPT PHYS,DK-2800 LYNGBY,DENMARK

来源：

IEEE TRANSACTIONS ON POWER APPARATUS AND SYSTEMS | 1975年 / 94卷 / 05期

关键词：

D O I：

10.1109/T-PAS.1975.32019

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

引用

页码：1749 / 1754

页数：6

共 22 条

[1]

Avrutskii V. A., 1973, Soviet Physics - Technical Physics, V18, P386

[2]

Avrutskii V. A., 1973, Soviet Physics - Technical Physics, V18, P389

[3]

BERGER S, 1974, B SEVVSE, V65, P511

[4]

BOUWERS A, 1939, ELECTRISCHE HOCHSTSP, P126

BOYD, HA ;

CRICHTON, GC .

PROCEEDINGS OF THE INSTITUTION OF ELECTRICAL ENGINEERS-LONDON, 1972, 119 (02) :275-&

[6] MEASUREMENT OF IONIZATION AND ATTACHMENT COEFFICIENTS IN SF6 [J].

BOYD, HA ;

CRICHTON, GC .

PROCEEDINGS OF THE INSTITUTION OF ELECTRICAL ENGINEERS-LONDON, 1971, 118 (12) :1872-&

[7]

DIESSNER A, 1974, ELEKTRIZITATSWIRTSCH, V73, P124

[8]

HAUSCHILD W, 1974, WISSENSCHAFTLICH TEC, P34

[9]

HOGG P, 1972, CIGRE2310 REP

[10]

IKEDA C, 1971, ELECTR ENG JPN, V91, P67