共 16 条
[3]
X-RAY SCATTERING AND COVALENT BONDING IN GERMANIUM
[J].
PROCEEDINGS OF THE ROYAL SOCIETY OF LONDON SERIES A-MATHEMATICAL AND PHYSICAL SCIENCES,
1967, 298 (1455)
:395-&
[4]
COVALENT BOND IN SILICON
[J].
PROCEEDINGS OF THE ROYAL SOCIETY OF LONDON SERIES A-MATHEMATICAL AND PHYSICAL SCIENCES,
1967, 298 (1455)
:379-&
[5]
X-RAY INTENSITY MEASUREMENTS ON LARGE CRYSTALS BY ENERGY-DISPERSIVE DIFFRACTOMETRY .2. ENERGY DEPENDENCES OF FRIEDEL PAIR INTENSITIES AND THEIR RATIO NEAR ABSORPTION-EDGE
[J].
ACTA CRYSTALLOGRAPHICA SECTION A,
1976, 32 (MAR1)
:245-249
[6]
X-RAY INTENSITY MEASUREMENTS ON LARGE CRYSTALS BY ENERGY-DISPERSIVE DIFFRACTOMETRY .1. ENERGY DEPENDENCES OF DIFFRACTION INTENSITIES NEAR ABSORPTION-EDGE
[J].
ACTA CRYSTALLOGRAPHICA SECTION A,
1976, 32 (JAN1)
:104-109
[7]
MEASUREMENT OF ANOMALOUS SCATTERING FACTORS NEAR GA K-ABSORPTION EDGE IN GAP
[J].
ACTA CRYSTALLOGRAPHICA SECTION A,
1975, A 31 (MAR1)
:215-220
[8]
X-RAY INTENSITY MEASUREMENTS ON LARGE CRYSTALS BY ENERGY-DISPERSIVE DIFFRACTOMETRY .3. FINE-STRUCTURES OF INTEGRATED-INTENSITIES AND ANOMALOUS SCATTERING FACTORS NEAR K ABSORPTION EDGES IN GAAS
[J].
ACTA CRYSTALLOGRAPHICA SECTION A,
1977, 33 (JAN1)
:54-58
[9]
FUKAMACHI T, 1971, ISSP12 TECH REP B, P1
[10]
FUKAMACHI T, IN PRESS