Atomic structure of nanocrystalline metals studied by diffraction techniques and exafs

被引:82
作者
Weissmuller, J
Loffler, J
Kleber, M
机构
[1] PAUL SCHERRER INST, CH-5232 VILLIGEN, SWITZERLAND
[2] UNIV SAARLAND, FACHBEREICH 15, D-66041 SAARBRUCKEN, GERMANY
来源
NANOSTRUCTURED MATERIALS | 1995年 / 6卷 / 1-4期
关键词
D O I
10.1016/0965-9773(95)00034-8
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
The relation between the nanometer-scale structure nod scattering and EXAFS experimental data is discussed on the basis of the atomic density distribution function. The available experimental information is reviewed, with an emphasis on the model substance Pd. Decreasing the grain-size to the nm-scale induces lattice strains and a modified Debye Waller parameter. Immediately after preparation, the grain boundaries are in a non-equilibrium state, which relaxes to a state with higher atomic short-range order upon aging at room temperature. Strong grain-growth at room temperature indicates a high atomic mobility in the grain boundary regions. Small-angle scattering appears to be dominated by porosity for all but the densest available samples.
引用
收藏
页码:105 / 114
页数:10
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