CRITICAL THICKNESS OF THIN LIQUID-FILMS - THEORY AND EXPERIMENT

被引：144

作者：

RADOEV, BP ^{[1
]}

SCHELUDKO, AD ^{[1
]}

MANEV, ED ^{[1
]}

机构：

[1] FAC CHEM SOFIA,DEPT PHYS CHEM,BLVD ANTON IVANOV 1,BU-1126 SOFIA,BULGARIA

来源：

JOURNAL OF COLLOID AND INTERFACE SCIENCE | 1983年 / 95卷 / 01期

关键词：

D O I：

10.1016/0021-9797(83)90094-2

中图分类号：

O64 [物理化学（理论化学）、化学物理学];

学科分类号：

070304 ; 081704 ;

摘要：

引用

页码：254 / 265

页数：12

共 20 条

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[5]

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[7]

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[8] SPECTROSCOPIC PARAMETERS FOR COMPUTATION OF VANDERWAALS FORCES [J].

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[9] VANDERWAALS INTERACTION FOR LIQUID WATER - COMPARISON OF OSCILLATOR MODEL APPROXIMATION AND USE OF KRAMERS-KRONIG EQUATION WITH FULL SPECTRAL DATA [J].

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[10] CRITICAL THICKNESS OF RUPTURE OF CHLORBENZENE AND ANILINE FILMS [J].

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MANEV, E .

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