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ELECTRON-DIFFRACTION IN POROUS SILICON

被引：13
作者：
PHILLIPP, F
URBAN, K
WILKENS, M
机构：
来源：
ULTRAMICROSCOPY | 1984年 / 13卷 / 04期
关键词：
D O I：
10.1016/0304-3991(84)90004-4
中图分类号：
TH742 [显微镜];
学科分类号：
摘要：
引用
收藏
页码：379 / 385
页数：7
相关论文
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[8]   ELECTRON-DIFFRACTION IN CRYSTALLINE SPECIMENS CONTAINING A HIGH-DENSITY OF LATTICE-DEFECTS .1. DEVELOPMENT OF A STATISTICAL-THEORY [J].
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