KERR EFFECT TOMOGRAPHY FOR NONINTRUSIVE SPATIALLY RESOLVED MEASUREMENTS OF ASYMMETRIC ELECTRIC-FIELD DISTRIBUTIONS

被引：37

作者：

HERTZ, HM

机构：

来源：

APPLIED OPTICS | 1986年 / 25卷 / 06期

关键词：

D O I：

10.1364/AO.25.000914

中图分类号：

O43 [光学];

学科分类号：

070207 ; 0803 ;

摘要：

引用

页码：914 / 921

页数：8

共 19 条

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