AUTOCORRELATION ANALYSIS OF HIGH-RESOLUTION ELECTRON-MICROGRAPHS OF NEAR-AMORPHOUS THIN-FILMS

被引：110

作者：

FAN, GY

COWLEY, JM

机构：

来源：

关键词：

D O I：

10.1016/0304-3991(85)90201-3

中图分类号：

TH742 [显微镜];

学科分类号：

摘要：

引用

页码：345 / 355

页数：11

共 7 条

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