X-RAY STRUCTURE OF CS-DOPED POLYACETYLENE

被引:20
作者
MA, J
DJURADO, D
FISCHER, JE
COUSTEL, N
BERNIER, P
机构
[1] UNIV PENN,DEPT MAT SCI & ENGN,PHILADELPHIA,PA 19104
[2] UNIV MONTPELLIER 2,DYNAM PHASES CONDENSEES GRP,F-34060 MONTPELLIER,FRANCE
[3] UNIV PENN,DEPT PHYS,PHILADELPHIA,PA 19104
来源
PHYSICAL REVIEW B | 1990年 / 41卷 / 05期
关键词
D O I
10.1103/PhysRevB.41.2971
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
The x-ray powder profile of heavily doped [(CH)Csy]x is analyzed on the basis of three dimensionally ordered intercalate channels. Fifteen peaks representing 27 unique reflections are well described (positions and intensities) by a tetragonal pseudocell with Ä=b»=9.093 AI, c»=7.950 AI containing 24 (CH) and 4 Cs units (y=0.167). The Cs and (CH) sublattices are actually incommensurate along c», with 6.46 undistorted (CH) units per Cs implying y=0.15. Reflections with nonzero L are significantly less intense than calculated neglecting the Debye-Waller factor, indicating large-amplitude c-axis thermal motion of Cs ions. The fractional linear in-plane dilation upon replacing K with Cs is within 20% of the corresponding value in graphite intercalates. © 1990 The American Physical Society.
引用
收藏
页码:2971 / 2975
页数:5
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