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ENHANCEMENT BETWEEN LAYERS IN MULTIPLE-LAYER THIN-FILM SAMPLES
被引:10
作者
:
WILLIS, JE
论文数:
0
引用数:
0
h-index:
0
WILLIS, JE
机构
:
来源
:
X-RAY SPECTROMETRY
|
1989年
/ 18卷
/ 04期
关键词
:
D O I
:
10.1002/xrs.1300180404
中图分类号
:
O433 [光谱学];
学科分类号
:
0703 ;
070302 ;
摘要
:
引用
收藏
页码:143 / 149
页数:7
相关论文
共 5 条
[1]
VERSATILE X-RAY ANALYSIS PROGRAM COMBINING FUNDAMENTAL PARAMETERS AND EMPIRICAL COEFFICIENTS
[J].
CRISS, JW
论文数:
0
引用数:
0
h-index:
0
机构:
USN,RES LAB,WASHINGTON,DC 20375
USN,RES LAB,WASHINGTON,DC 20375
CRISS, JW
;
BIRKS, LS
论文数:
0
引用数:
0
h-index:
0
机构:
USN,RES LAB,WASHINGTON,DC 20375
USN,RES LAB,WASHINGTON,DC 20375
BIRKS, LS
;
GILFRICH, JV
论文数:
0
引用数:
0
h-index:
0
机构:
USN,RES LAB,WASHINGTON,DC 20375
USN,RES LAB,WASHINGTON,DC 20375
GILFRICH, JV
.
ANALYTICAL CHEMISTRY,
1978,
50
(01)
:33
-37
[2]
X-RAY-FLUORESCENCE ANALYSIS OF MULTIPLE-LAYER FILMS
[J].
MANTLER, M
论文数:
0
引用数:
0
h-index:
0
机构:
IBM CORP,RES LABS,SAN JOSE,CA 95193
IBM CORP,RES LABS,SAN JOSE,CA 95193
MANTLER, M
.
ANALYTICA CHIMICA ACTA,
1986,
188
:25
-35
[3]
SECONDARY EXCITATION IN XRAY FLUORESCENCE ANALYSIS OF THIN PLANAR FILMS
[J].
POLLAI, G
论文数:
0
引用数:
0
h-index:
0
POLLAI, G
;
MANTLER, M
论文数:
0
引用数:
0
h-index:
0
MANTLER, M
;
EBEL, H
论文数:
0
引用数:
0
h-index:
0
EBEL, H
.
SPECTROCHIMICA ACTA PART B-ATOMIC SPECTROSCOPY,
1971,
B 26
(12)
:747
-&
[4]
WILLIAMS N, 1988, MICROWAVE J, V31, P175
[5]
[No title captured]
←
1
→
共 5 条
[1]
VERSATILE X-RAY ANALYSIS PROGRAM COMBINING FUNDAMENTAL PARAMETERS AND EMPIRICAL COEFFICIENTS
[J].
CRISS, JW
论文数:
0
引用数:
0
h-index:
0
机构:
USN,RES LAB,WASHINGTON,DC 20375
USN,RES LAB,WASHINGTON,DC 20375
CRISS, JW
;
BIRKS, LS
论文数:
0
引用数:
0
h-index:
0
机构:
USN,RES LAB,WASHINGTON,DC 20375
USN,RES LAB,WASHINGTON,DC 20375
BIRKS, LS
;
GILFRICH, JV
论文数:
0
引用数:
0
h-index:
0
机构:
USN,RES LAB,WASHINGTON,DC 20375
USN,RES LAB,WASHINGTON,DC 20375
GILFRICH, JV
.
ANALYTICAL CHEMISTRY,
1978,
50
(01)
:33
-37
[2]
X-RAY-FLUORESCENCE ANALYSIS OF MULTIPLE-LAYER FILMS
[J].
MANTLER, M
论文数:
0
引用数:
0
h-index:
0
机构:
IBM CORP,RES LABS,SAN JOSE,CA 95193
IBM CORP,RES LABS,SAN JOSE,CA 95193
MANTLER, M
.
ANALYTICA CHIMICA ACTA,
1986,
188
:25
-35
[3]
SECONDARY EXCITATION IN XRAY FLUORESCENCE ANALYSIS OF THIN PLANAR FILMS
[J].
POLLAI, G
论文数:
0
引用数:
0
h-index:
0
POLLAI, G
;
MANTLER, M
论文数:
0
引用数:
0
h-index:
0
MANTLER, M
;
EBEL, H
论文数:
0
引用数:
0
h-index:
0
EBEL, H
.
SPECTROCHIMICA ACTA PART B-ATOMIC SPECTROSCOPY,
1971,
B 26
(12)
:747
-&
[4]
WILLIAMS N, 1988, MICROWAVE J, V31, P175
[5]
[No title captured]
←
1
→