OPTIMIZATION OF AN XRF SET-UP BY USING HIGHLY POLARIZED EXCITING RADIATION

被引:3
作者
KIRSCHKE, P
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D O I
10.1016/0168-9002(86)90467-5
中图分类号
TH7 [仪器、仪表];
学科分类号
0804 ; 080401 ; 081102 ;
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页码:566 / 568
页数:3
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共 4 条
[1]   X-RAY-FLUORESCENCE ANALYSIS IN THE NANOGRAM REGION WITH A TOTAL REFLECTED AND A BRAGG POLARIZED PRIMARY BEAM [J].
AIGINGER, H ;
WOBRAUSCHEK, P .
JOURNAL OF RADIOANALYTICAL CHEMISTRY, 1981, 61 (1-2) :281-293
[2]  
BISGARD KM, 1980, REPORT ROYAL VET AGR
[3]   X-RAY-FLUORESCENCE SPECTROMETER WITH TOTALLY REFLECTING SAMPLE SUPPORT FOR TRACE ANALYSIS AT PPB LEVEL [J].
KNOTH, J ;
SCHWENKE, H .
FRESENIUS ZEITSCHRIFT FUR ANALYTISCHE CHEMIE, 1978, 291 (03) :200-204
[4]  
RYON RW, 1979, ADV XRAY ANAL, V22, P453