SURFACE-ANALYSIS USING ION-SCATTERING SPECTROSCOPY - EFFECT OF RESOLUTION AND INTENSITY MEASURE ON SURFACE ATOM DENSITY RATIOS

被引：33

作者：

YOUNG, VY

HOFLUND, GB

机构：

[1] UNIV FLORIDA,DEPT CHEM ENGN,GAINESVILLE,FL 32611

[2] UNIV FLORIDA,DEPT CHEM,GAINESVILLE,FL 32611

来源：

ANALYTICAL CHEMISTRY | 1988年 / 60卷 / 03期

关键词：

D O I：

10.1021/ac00154a017

中图分类号：

O65 [分析化学];

学科分类号：

070302 ; 081704 ;

摘要：

引用

页码：269 / 274

页数：6

共 24 条

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