THE UNSYMMETRY X-RAY-DIFFRACTION METHOD AND QUANTITATIVE TEXTURE ANALYSIS OF TEXTURED BI-2212 SAMPLES

被引：6

作者：

ZHAO, J

DONG, C

WU, F

CHEN, H

CHE, GC

JIA, SL

ZHAO, ZX

机构：

[1] Inst. of Phys., Chinese Acad. of Sci., Beijing

来源：

SUPERCONDUCTOR SCIENCE & TECHNOLOGY | 1995年 / 8卷 / 06期

关键词：

D O I：

10.1088/0953-2048/8/6/007

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

Textured high-T(c) Bi-2212 samples (T(c) = 93 K) were prepared by solid state reaction. The unsymmetry x-ray diffraction (UXRD) method is used to study the texture of the samples. The orientation distribution function (ODF) f(theta) is obtained. The degree of preferred orientation is quantitatively determined by the FWHM (full width at half maximum) of the ODF curves. In the meantime, the results of the rocking curve method and the preferred orientation parameter method for quantitative texture determination are analysed comparatively.

引用

页码：439 / 442

页数：4

共 9 条

[1] A FAST X-RAY-DIFFRACTION METHOD FOR THE SURFACE ORIENTATION ANALYSIS OF LARGE POLYCRYSTALLINE SAMPLES [J].