DEVELOPMENT OF A FLAT-FIELD GRAZING-INCIDENCE XUV SPECTROMETER AND ITS APPLICATION IN PICOSECOND XUV SPECTROSCOPY

被引：151

作者：

NAKANO, N ^{[1
]}

KURODA, H ^{[1
]}

KITA, T ^{[1
]}

HARADA, T ^{[1
]}

机构：

[1] HITACHI LTD,CENT RES LAB,KOKUBUNJI,TOKYO 185,JAPAN

来源：

APPLIED OPTICS | 1984年 / 23卷 / 14期

关键词：

D O I：

10.1364/AO.23.002386

中图分类号：

O43 [光学];

学科分类号：

070207 ; 0803 ;

摘要：

引用

页码：2386 / 2392

页数：7

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