DIRECT LATTICE IMAGING OF SILICON-CARBIDE

被引：5

作者：

GAI, PL ^{[1
]}

ANDERSON, JS ^{[1
]}

RAO, CNR ^{[1
]}

机构：

[1] UNIV OXFORD,INORG CHEM LAB,OXFORD OX1 3QR,ENGLAND

来源：

关键词：

D O I：

10.1088/0022-3727/8/13/002

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

引用

页码：L157 / &

共 6 条

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[2] ELECTRON-MICROSCOPE IMAGE CONTRAST FOR THIN CRYSTALS
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IIJMA, S
[J]. ZEITSCHRIFT FUR NATURFORSCHUNG PART A-ASTROPHYSIK PHYSIK UND PHYSIKALISCHE CHEMIE, 1972, A 27 (03): : 445 - +
[3] DIRECT CORRELATION BETWEEN LATTICE FRINGES AND ATOMIC POSITIONS IN DEFECT STRUCTURES IN N-NIOBIUM OXIDE
HUTCHISON, JL
ANDERSON, JS
[J]. PHYSICA STATUS SOLIDI A-APPLICATIONS AND MATERIALS SCIENCE, 1972, 9 (01): : 207 - +
[4] ELECTRON-MICROSCOPY OF BARIUM FERRITE LAYER STRUCTURES
MCCONNELL, JD
HUTCHISON, JL
ANDERSON, JS
[J]. PROCEEDINGS OF THE ROYAL SOCIETY OF LONDON SERIES A-MATHEMATICAL AND PHYSICAL SCIENCES, 1974, 339 (1616) : 1 - +
[5] ANALYTICAL REPRESENTATION OF ATOMIC SCATTERING AMPLITUDES FOR ELECTRONS
SMITH, GH
BURGE, RE
[J]. ACTA CRYSTALLOGRAPHICA, 1962, 15 (03): : 182 - &
[6] VERMA AR, 1966, POLYMORPHISM POLYTPI